Kamenskih, A. N, Perm National Research Polytechnic University
Issue | Section | Title | Abstract | File |
No 2 (2016) | Articles | THE ANALYSIS OF DIAGNOSTIC PROPERTIES OF SELF-TIMED CIRCUITS IN CASE OF FAULTS USING FUNCTIONAL APPROACH | Abstract |
(Rus) |
No 2 (2016) | Articles | FORMAL SYSTEM FOR FAULT-TOLERANT CMOS SELF-TIMED CIRCUITS | Abstract |
(Rus) |
No 1 (2016) | Articles | ANALYSIS OF GUIDE TO ICS SECURITY TO IDENTIFY THE TYPICAL VULNERABILITIES | Abstract |
(Rus) |
No 4 (2015) | Articles | WEAK MULLER’S C-GATE | Abstract |
(Rus) |
No 2 (2014) | Articles | THE PROTECTION OF DIGITAL DEVICE FROM SIGNEL STUCK-AT FAULT USING REDUNDANT TRANSISTOR STRUCTURES | Abstract |
(Rus) |
No 1 (2014) | Articles | THE ANALYSIS OF SELF-TIMED FULL-ADDER IN TERMS OF FAULT-TOLERANCE | Abstract |
(Rus) |